Systematic modelling and comparisons of capacitance and current-based microscopic defect analysis techniques for measurements of high-resistivity silicon detectors after irradiation - Concepedia

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Systematic modelling and comparisons of capacitance and current-based microscopic defect analysis techniques for measurements of high-resistivity silicon detectors after irradiation

34

Citations

18

References

1998

Year

Nuclear Instruments and Methods in Physics Research Section A Accelerators Spectrometers Detectors and Associated Equipment

Electrical EngineeringEngineeringRadiation DetectionPhysicsNanoelectronicsSilicon DebuggingApplied PhysicsSemiconductor Device FabricationInstrumentationSilicon On InsulatorMicroelectronicsHigh-resistivity Silicon DetectorsSystematic Modelling

References

	Year	Citations

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