Rapid Embedded System Testing Using Verification Patterns

Abstract

Testing is often difficult, and testing real-time embedded systems for mission-critical applications is particularly difficult owing to embedded design complexities and frequent requirements changes. Embedded systems usually require a series of rigorous white-box (structural), black-box (functional), module, and integration testing before developers can release them to the market. In practice, functional testing is often more important than structural testing. Similarly, integration testing is more challenging than module testing. Furthermore, functional integration testing often requires individual test scripts based on the system requirements.