DLTS analysis of nickel–hydrogen complex defects in silicon - Concepedia

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DLTS analysis of nickel–hydrogen complex defects in silicon

38

Citations

8

References

1999

Year

Masahiro Shiraishi, J.-U. Sachse, Heinz U. Lemke, J. Weber

Materials Science and Engineering B

EngineeringCrystalline DefectsDlts AnalysisApplied PhysicsDefect FormationDefect Tolerance

References

	Year	Citations

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