Ultra-high voltage electron microscopy and its applications to new research fields in materials science.

Abstract

The electron channeling, whoserate is proportional to the relativistic mass of an electron, occurs at high accelerating voltages by interaction amongmany simultaneously excited electron waves. As a result, the maximum observable specimenthickness markedly increases with increasing the voltage, so that essentially the same behavior of lattice defects in almost all materials can be observed dynamically as that in bulk specimenswith an ultra-high voltage electron microscope (UHVEM). /n situ experiments with UHVEM have beencarried out in many research fieids of natural science, particuiarly materials science.