Publication | Closed Access
Ex situ and in situ determination of stress distributions in chromium oxide films by raman microscopy
100
Citations
9
References
1992
Year
Materials ScienceEx SituSurface CharacterizationRaman MicroscopyEngineeringMaterial AnalysisNanomaterialsNanotechnologyOxide ElectronicsSurface ScienceApplied PhysicsSitu DeterminationThin Film Processing
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