Dielectric loss tangent of sapphire single crystal produced by edge-defined film-fed growth method

Microwave Measurement of Dielectric Properties of Low-Loss Materials by the Dielectric Rod Resonator Method

Yoichi Kobayashi, Masahiko Katoh · IEEE Transactions on Microwave Theory and Techniques · 1985 · 660 citations

Natural Sciences, Electrical Engineering, Materials Science +17

Growth of controlled profile crystals from the melt: Part II - Edge-defined, film-fed growth (EFG)

H.E. LaBelle · Materials Research Bulletin · 1971 · 160 citations

Natural Sciences, Materials Engineering, Materials Science +11

High-T/sub c/-superconductor-sapphire microwave resonator with extremely high Q-values up to 90 K

Zhongxiang Shen, C. Wilker, P. Pang et al. · IEEE Transactions on Microwave Theory and Techniques · 1992 · 155 citations

Natural Sciences, Electrical Engineering, Physics +15

Surface resistance measurements of HTS films by means of sapphire dielectric resonators

Jerzy Krupka, M. Klinger, Manuela Kuhn et al. · IEEE Transactions on Applied Superconductivity · 1993 · 128 citations

Natural Sciences, Electrical Engineering, Materials Science +15

A sapphire resonator for microwave characterization of superconducting thin films

C. Wilker, Zhongxiang Shen, V.X. Nguyen et al. · IEEE Transactions on Applied Superconductivity · 1993 · 83 citations

Natural Sciences, Electrical Engineering, Physics +17