Composition, depth profiles and lateral distribution of materials in the SEI built on HOPG-TOF SIMS and XPS studies - Concepedia

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Publication | Closed Access

Composition, depth profiles and lateral distribution of materials in the SEI built on HOPG-TOF SIMS and XPS studies

252

Citations

8

References

2001

Year

E. Peled, D. Bar Tow, Alexandra Merson, A. Gladkich, L. Burstein, Diana Golodnitsky

Journal of Power Sources

Materials EngineeringMaterials ScienceEngineeringApplied PhysicsDepth ProfilesLateral DistributionHopg-tof Sims

References

	Year	Citations

Page 1