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Experimental study of the band structure of GaP, GaAs, GaSb, InP, InAs, and InSb
93
Citations
8
References
1986
Year
SemiconductorsElectronic DevicesEngineeringPolarization-dependent Angle-resolved PhotoemissionPhysicsCollection AnglesBand StructureCritical-point EnergiesApplied PhysicsQuantum MaterialsCondensed Matter PhysicsExperimental StudySemiconductor MaterialPhotoelectric MeasurementElectronic StructureCompound SemiconductorSolid-state Physic
An experimental study of the band structures of GaP, GaAs, GaSb, InP, InAs, and InSb has been made with use of polarization-dependent angle-resolved photoemission. We describe an analysis of the data which allowed us to do band mapping (E vs ${\mathrm{k}}_{\ensuremath{\perp}}$) among some 30 bands both occupied and unoccupied, distributed in the range from 20 eV above to 8 eV below the valence-band maximum. The measurements were made for the 〈110〉 direction \ensuremath{\Gamma}--K--X along line \ensuremath{\Sigma} in the Brillouin zone. The experiments utilized synchrotron-radiation-induced photoemission in which the polarization of the light and collection angles of the electrons were carefully controlled. We compare the data with calculated band structures and tabulate critical-point energies.
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