Integrating Test Levels for Embedded Systems

Abstract

The increasing importance of embedded software has produced a shift in the testing activities from system testing towards software testing. This has contributed to testing the core system functionality earlier on in the test process. However, this shift has also led to very similar test cases being both described and executed independently at different test levels. We propose reusing multi-level test cases for supporting seamless test level integration. As a consequence, single test case specifications and implementations are reused throughout the test process, minimizing the test implementation effort and taking advantage of the synergies among test levels.