X-ray micro-beam characterization of lattice rotations and distortions due to an individual dislocation - Concepedia

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X-ray micro-beam characterization of lattice rotations and distortions due to an individual dislocation

DOI Full Paper Access

54

Citations

40

References

2013

Year

Felix Hofmann, Brian Abbey, Wenjun Liu, Ruqing Xu, Brian F. Usher, Eugeniu Balaur, Yuzi Liu

Nature Communications

Materials ScienceLattice RotationsX-ray Micro-beam CharacterizationEngineeringSevere Plastic DeformationStrain LocalizationDislocation InteractionIndividual DislocationApplied PhysicsX-ray DiffractionSolid MechanicsMicrostructure-strength RelationshipCrystallographyMechanics Of MaterialsMicrostructure

References

	Year	Citations

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