Metrologia · 2003 · 167 citations · 39 references
Natural SciencesChemistryPhysicsAnalytical ChemistryMaterials CharacterizationPhysical ChemistryCrystal ChemistryCrystallographyGravimetric AnalysisStructure DeterminationX-ray CrystallographyX-ray DiffractionCrystal Structure-property RelationshipsLattice Parameter AnalysisLattice Parameter DeterminationLattice Parameter MeasurementMolar MassRepeatabilitySingle-crystal Silicon
A value for the Avogadro constant, NA, was derived from new measurements of the lattice parameter, the density and the molar mass of a silicon single crystal. The result NA = 6.022 135 3 × 1023 mol−1 has a relative measurement uncertainty and is in excellent agreement with other published data based on the x-ray crystal density molar mass method, indicating the high repeatability of these experiments. The value differs significantly from the Committee on Data for Science and Technology's most recent recommended value of 6.022 141 99 × 1023 mol−1 by more than 1 × 10−6 NA.
39
Steven D. Bass · The European Physical Journal A · 1999 · 1.2K citations · Full text
Guide to the Expression of Uncertainty in Measurement
Barry N. Taylor, C. E. Kuyatt · 1995 · 821 citations
Meijie Tang, Luciano Colombo, Jing Zhu et al. · Physical review. B, Condensed matter · 1997 · 267 citations
Absolute Measurement of the (220) Lattice Plane Spacing in a Silicon Crystal
Peter Becker, K. Dorenwendt, G. Ebeling et al. · Physical Review Letters · 1981 · 221 citations