Current induced bunches of steps on the Si(111) surface – a key to measuring the temperature dependence of the step interaction coefficient - Concepedia

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Current induced bunches of steps on the Si(111) surface – a key to measuring the temperature dependence of the step interaction coefficient

26

Citations

27

References

2000

Year

S. Stoyanov, J.J. Métois, Vesselin Tonchev

Surface Science

Electrical EngineeringEngineeringPhysicsSurface ScienceApplied PhysicsTemperature DependenceSiliceneSemiconductor MaterialStep Interaction CoefficientSilicon On Insulator

References

	Year	Citations

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