Concepedia

Properties of oxidized silicon as determined by angular-dependent X-ray photoelectron spectroscopy

Jeffrey Hill, D. G. Royce, C. S. Fadley, Leopold Wagner, F. J. Grunthaner

Chemical Physics Letters · 1976 · 275 citations · 16 references

DOI

Concepts

References

16

1. A - C

Eugen Reichel · 1909 · 1.5K citations

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Surface analysis and angular distributions in x-ray photoelectron spectroscopy

C. S. Fadley, R. J. Baird, W. J. Siekhaus et al. · Journal of Electron Spectroscopy and Related Phenomena · 1974 · 434 citations · Full text

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Electron mean escape depths from x−ray photoelectron spectra of thermally oxidized silicon dioxide films on silicon

R. Flitsch, S. I. Raider · Journal of Vacuum Science and Technology · 1975 · 258 citations

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Oxide Growth on Etched Silicon in Air at Room Temperature

S. I. Raider, R. Flitsch, Maghmood Palmer · Journal of The Electrochemical Society · 1975 · 217 citations

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Surface sensitivity and angular dependence of X-ray photoelectron spectra

W. A. Fraser, J.V. Florio, W. Nicholas Delgass et al. · Surface Science · 1973 · 143 citations

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