Unsupervised spatial pattern classification of electrical-wafer-sorting maps in semiconductor manufacturing - Concepedia

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Unsupervised spatial pattern classification of electrical-wafer-sorting maps in semiconductor manufacturing

55

Citations

9

References

2005

Year

Federico Di Palma, Giuseppe De Nicolao, Gaetano Miraglia, E. Pasquinetti, F. Piccinini

Pattern Recognition Letters

EngineeringData ScienceIndustrial EngineeringPattern RecognitionData MiningSpatial Pattern ClassificationPattern AnalysisComputational GeometrySelf-organizing MapPattern Recognition Application

References

	Year	Citations

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