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X-ray topographic study of ?-NiAl upon growth of an ?-Al2O3 film

Materials EngineeringMaterials ScienceAluminium NitrideX-ray SpectroscopyEngineeringCrystal Growth TechnologySurface ScienceApplied PhysicsX-ray Diffraction-Al2o3 FilmX-ray Topographic StudyChemistryCrystallographyThin Film ProcessingMicrostructure