Crystal Growth and Some Properties of Lead Indium Niobate-Lead Titanate Single Crystals Produced by Solution Bridgman Method

Naohiko Yasuda, Noriaki Mori, Hidehiro Ohwa, Yasuharu Hosono, Yohachi Yamashita, Makoto Iwata, Masaki Maeda, Ikuo Suzuki, Yoshihiro Ishibashi

Japanese Journal of Applied Physics · 2002 · 27 citations · 4 references

Concepts

Abstract

A single crystal about 15 mm in diameter and 10 mm in length of the lead indium niobate-lead titanate, (1-x)Pb(In1/2Nb1/2)O3–xPbTiO3[PIN–PT(1-x/x)] solid solution system near a morphotropic phase boundary was obtained by the solution Bridgman method using PbO–B2O3 flux. X-ray diffraction study reveals that the ingot cut perpendicularly to the cylindrical as-grown PIN–PT(63/37)(the starting composition) single crystal length exhibits the (110) plane of the perovskite phase, and the wafers cut 2 mm and 10 mm from the bottom of the cylindrical PIN–PT single crystal exhibit the rhombohedral phase and tetragonal one at room temperature, respectively. The crystal growth was almost along the [110] direction. The Ti contents x of these wafers cut at 2 mm and at 10 mm were determined by Inductive Charge Plasma (ICP) chemical analysis to be 0.31 and 0.35, respectively. The Ti content of the as-grown PIN–PT(63/37)(the starting composition) single crystal was found to increase with growth away from the nucleation point. For x=0.31, the relative permittivity εr has a peak (37000 at 10 kHz) at the Curie temperature Tc, 300°C and then a shoulder at the ferroelectric rhombohedral to tetragonal phase transition temperature, 120°C with cooling. For x=0.35, the εr has a peak (25000 at 10 kHz) at Tc, 313°C.

References

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