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Strain distribution in bent ZnO microwires
49
Citations
24
References
2011
Year
Optical MaterialsEngineeringZno MicrowiresSevere Plastic DeformationMechanical EngineeringOptoelectronic DevicesLuminescence PropertySemiconductor NanostructuresStressstrain AnalysisEnergetic ShiftNanoscale ScienceMaterials SciencePhotoluminescencePhysicsNanotechnologyOxide ElectronicsOptoelectronic MaterialsStrain DistributionSolid MechanicsMicrostructureApplied PhysicsWire LuminescenceOptoelectronicsMechanics Of MaterialsHigh Strain Rate
ZnO microwires grown by carbothermal reduction were mechanically bent and the uniaxial stress state was studied with spatially resolved low-temperature photoluminescence. Inhomogeneous (tensile and compressive) stress (up to ±1 GPa) is visualized by the redshift and blueshift of the wire luminescence. Experimentally determined tensile and compressive strain along the c-axis (wire axis) of up to 1.5 %, symmetrically distributed with respect to the central axis (neutral fiber), is achieved, resulting in maximum energetic shifts of ±30 meV. Within these experiments, we are able to precisely determine the direct relation between energetic shift of the free A-exciton energy and strain to (−2.04±0.02) eV.
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