Modulated Surface-Plasmon Resonance for<i>In Situ</i>Metal-Film Surface Studies

Abstract

A new experimental technique, angle-of-incidence modulated surface plasmon resonance, is used for in situ studies on noble-metal films. The method is used to record the real and imaginary parts of the surface-plasmon wave vector and the strength of the surface roughness scattering during room-temperature ${\mathrm{O}}_{2}$ exposure. The atomic susceptibility of oxygen on Cu at 632.8 nm is found to be ${\ensuremath{\chi}}_{a}=(1.2+1.6i)\ifmmode\times\else\texttimes\fi{}{10}^{\ensuremath{-}24}$ ${\mathrm{cm}}^{3}$. Roughly 0.2% of a monolayer can be detected.