A highly configurable test system for evolutionary black-box testing of embedded systems

Abstract

During the development of electronic control units (ECU) in domains like the automotive industry, tests are performed on various test platforms, such as model-in-the-loop, software-in-the-loop, processor-in-the-loop, and hardware-in-the-loop platforms in order to find faults in early development stages. Test cases must be specified to verify the properties demanded of the system on these test platforms. This is an expensive and non-trivial task. Evolutionary black-box testing, a recent approach to automating the creation of interesting test cases, can solve this task completely automatically.