Publication | Closed Access

Solution for the critical thickness models of dislocation generation in epitaxial thin films using the Lambert W function

Materials ScienceEngineeringLambert W FunctionDislocation InteractionApplied PhysicsCritical Thickness ModelsDefect FormationMultilayer HeterostructuresThin FilmsMolecular Beam EpitaxyEpitaxial GrowthDislocation Generation