Concepedia

Empirical formula for the calculation of secondary ion yields from oxidized metal surfaces and metal oxides

C. Plog, L. Wiedmann, A. Benninghoven

Surface Science · 1977 · 139 citations · 15 references

DOI

Concepts

References

15

Surface investigation of solids by the statical method of secondary ion mass spectroscopy (SIMS)

A. Benninghoven · Surface Science · 1973 · 447 citations

, , +14

Thermodynamic approach to the quantitative interpretation of sputtered ion mass spectra

Charles A. Andersen, James Hinthorne · Analytical Chemistry · 1973 · 436 citations

, , +9

Progress in analytic methods for the ion microprobe mass analyzer

Charles A. Andersen · International Journal of Mass Spectrometry and Ion Physics · 1969 · 194 citations

, , +13

A quantum-mechanical model for the ionization and excitation of atoms during sputtering

Juergen M. Schroeer, T. N. Rhodin, Richard C. Bradley · Surface Science · 1973 · 188 citations

, , +8

Analysis of Submonolayers on Silver by Negative Secondary Ion Emission

A. Benninghoven · physica status solidi (b) · 1969 · 107 citations

, , +10