Review of Scientific Instruments · 1996 · 171 citations · 6 references
Natural SciencesMaterials EngineeringMaterials ScienceHeat TransferThermal AnalysisThermodynamicsCalorimetryDifferential Scanning CalorimetryMelting Behavior AnalysisTemperature MeasurementThermal Properties Of MaterialsThermal SensorsDifferential CalorimetryMicroscopic Melting ObservationsMicroscopyThermal Analysis Of Phase TransitionsThermal CharacterizationThermal DecompositionThermal Decomposition ReactionsThermal Response Characterization
The authors introduce a differential, miniaturized resistive probe that enables spatially localized calorimetric analysis and paves the way for scanning calorimetric microscopy, while noting that quantitative interpretation requires mathematical modeling. The technique uses a differential arrangement with an active probe that simultaneously serves as a localized heat source and thermometer to perform spatially resolved calorimetry. The probe detected glass transitions, melting, recrystallization, and decomposition in polymer volumes of a few μm³, and these events matched those observed with conventional calorimetry.
We describe a novel thermal characterization technique based on a differential arrangement, which achieves spatially localized calorimetric analysis. It involves the use of an active probe which acts both as a highly localized heat source and a thermometer. This ability opens the way for the implementation of scanning calorimetric microscopy where image contrast will be created from thermal analysis data. For a number of polymers we have recorded events such as glass transitions, meltings, recrystallizations and thermal decomposition within volumes of material estimated at a few μm3. The data obtained are compared with those obtained from conventional calorimetry and the events registered in both cases are found to match. For a full quantitative analysis of the results obtained, mathematical modelling of the operation of the technique, taking account of physical and other changes in materials, is required.
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Sub-surface imaging by scanning thermal microscopy
A. Hammiche, H. M. Pollock, M. Song et al. · Measurement Science and Technology · 1996 · 116 citations