Length scaling of the Double Gate Tunnel FET with a high-K gate dielectric - Concepedia

Concepedia

Publication | Open Access

Length scaling of the Double Gate Tunnel FET with a high-K gate dielectric

DOI Full Paper Access

222

Citations

16

References

2007

Year

Kathy Boucart, Adrian M. Ionescu

Solid-State Electronics

Electrical EngineeringHigh-k Gate DielectricEngineeringTunneling MicroscopyPhysicsNanoelectronicsElectronic EngineeringLength ScalingApplied PhysicsCondensed Matter PhysicsBias Temperature InstabilityMicroelectronicsSemiconductor Device

References

	Year	Citations

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