Publication | Closed Access
A survey of the geometrical reconstruction of [011] defects in semiconductors: Grain boundaries and dislocations
66
Citations
8
References
1985
Year
SemiconductorsGrain BoundariesEngineeringPhysicsGeometrical ReconstructionDislocation InteractionSevere Plastic DeformationStrain LocalizationApplied PhysicsDefect FormationDefect ToleranceMicrostructure
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