Publication | Closed Access
Yield and angular distribution of cesium sputtered copper using a radioactive tracer technique.
13
Citations
12
References
1966
Year
Materials ScienceEngineeringAngular DistributionIon BombardmentApplied PhysicsMetallurgical ProcessInstrumentationRadioactive Tracer TechniqueElemental MetalElemental CharacterizationCermetMicrostructure
Radioactive tracer technique to measure yield and angular distribution of copper sputtered from monocrystalline target subject to cesium ion bombardment
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