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Red Electroluminescence and Crystallinity of ZnS:SmF<sub>3</sub> Thin Films
21
Citations
2
References
1984
Year
Materials ScienceIi-vi SemiconductorElectrical EngineeringPhotoluminescenceEngineeringNanoelectronicsApplied PhysicsLuminescence PropertyRed ElectroluminescenceThin FilmsMicroelectronicsSmf 3OptoelectronicsCompound SemiconductorEmission Decay TimeThin Film ProcessingBright Red Electroluminescence
The dependence of the red emission characteristics (emission efficiency, brightness and emission decay time) and crystallinity of ZnS:SmF 3 thin-film electroluminescent (TFEL) devices upon fabrication parameters such as the SmF 3 concentration and substrate temperature during evaporation, has been investigated. The electroluminescent characteristics are considered to be influenced more by the SmF 3 concentration and the grain height in the film thickness direction, than by the cubic ZnS structure {111} plane orientation and the film uniformity, or by the degree to which the cubic {111} plane is oriented parallel to the substrate. A bright red electroluminescence of 1000 cd/m 2 under 5 kHz sinusoidal voltage excitation and an emission efficiency of 0.078 lm/W are obtained in these ZnS:SmF 3 TFEL devices.
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