The origin of giant dielectric relaxation and electrical responses of grains and grain boundaries of W-doped CaCu3Ti4O12 ceramics

Abstract

The origin of giant dielectric relaxation behavior and related electrical properties of grains and grain boundaries (GBs) of W6+-doped CaCu3Ti4O12 ceramics were studied using admittance and impedance spectroscopy analyses based on the brick–work layer model. Substitution of 1.0 at. % W6+ caused a slight decrease in GB capacitance, leading to a small decrease in the low-frequency dielectric constant. Surprisingly, W6+ doping ions have remarkable effects on the macroscopic dielectric relaxation and electrical properties of grains. X-ray photoelectron spectroscopy analysis suggested that the large enhancements of grain resistance and conduction activation energy of grains for the W6+-doped CaCu3Ti4O12 ceramic are caused by reductions in concentrations of Cu3+ and Ti3+ ions. Considering variation of dielectric properties together with changes in electrical properties of the W6+-doped CaCu3Ti4O12 ceramic, correlation between giant dielectric properties and electrical responses of grains and GBs can be described well by the internal barrier layer capacitor model. This model can ascribe mechanisms related to giant dielectric response and relaxation behavior in CaCu3Ti4O12 ceramics.