Optics Communications · 1996 · 140 citations · 14 references
Natural SciencesMaterials EngineeringMaterials ScienceMaterials CharacterizationSurface ScienceThin FilmsDielectric PropertiesOptical Thin FilmsPlasmonic MaterialsPlasmonicsThin Film Optical PropertiesThin-film MaterialsDielectric CharacterizationDielectric ConstantDielectric Constant EstimationDielectric Constant MeasurementSurface Plasmon SpectroscopySurface PlasmonsThickness-dependent Optical PropertiesThin-film Optical Characterization
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American Institute of Physics Handbook
Irving E. Dayton · American Journal of Physics · 1964 · 3K citations
Stephen R. Wasserman, George M. Whitesides, I. M. Tidswell et al. · Journal of the American Chemical Society · 1989 · 405 citations · Full text