Publication | Open Access
Lateral oxidation of InAlAs in InP-based heterostructures for long wavelength vertical cavity surface emitting laser applications
39
Citations
11
References
1998
Year
Materials ScienceLateral OxidationElectrical EngineeringInp-based HeterostructuresEngineeringWide-bandgap SemiconductorOxidation ResistanceOptical PropertiesIn0.53ga0.47as Adjacent LayersApplied PhysicsLaser ApplicationsOptical ConfinementMolecular Beam EpitaxyMicroelectronicsWet Thermal OxidationOptoelectronicsCategoryiii-v SemiconductorCompound Semiconductor
We have studied the wet thermal oxidation of In0.52Al0.48As and its potential application in current and optical confinement in vertical cavity surface emitting lasers (VCSELs). Two types of InP-based heterostructures were used to study the effect of adjacent layer compositions on the lateral oxidation behavior of the InAlAs. It was found that the oxidation of In0.52Al0.48As with InP adjacent layers, compared with In0.53Ga0.47As adjacent layers, proceeded faster, more uniformly and with minimal degradation of the surrounding layers making it ideal for optoelectronic applications.
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