Crystal and electronic structures of pentacene thin films from grazing-incidence x-ray diffraction and first-principles calculations

Abstract

Combined experimental and theoretical investigations on thin films of pentacene are performed in order to determine the structure of the pentacene thin film phase. Grazing incidence x-ray diffraction is used for studying a pentacene thin film with a nominal thickness of $180\phantom{\rule{0.3em}{0ex}}\mathrm{nm}$. The crystal structure is found to exhibit the lattice parameters $a=0.592\phantom{\rule{0.3em}{0ex}}\mathrm{nm}$, $b=0.754\phantom{\rule{0.3em}{0ex}}\mathrm{nm}$, $c=1.563\phantom{\rule{0.3em}{0ex}}\mathrm{nm}$, $\ensuremath{\alpha}=81.5\ifmmode^\circ\else\textdegree\fi{}$, $\ensuremath{\beta}=87.2\ifmmode^\circ\else\textdegree\fi{}$, and $\ensuremath{\gamma}=89.9\ifmmode^\circ\else\textdegree\fi{}$. These crystallographic unit cell dimensions are used as the only input parameters for ab initio total-energy calculations within the framework of density functional theory revealing the molecular packing within the crystal structure. Moreover, we calculate the electronic band structure of the thin film phase and compare it to that of the bulk phase. We find the intermolecular bandwidths of the thin film phase to be significantly larger compared to the bulk structure, e.g., the valence bandwidth is twice as large. This remarkable effect is traced back to an enhanced intermolecular $\ensuremath{\pi}\text{\ensuremath{-}}\ensuremath{\pi}$ overlap due to the upright standing molecules in the thin film phase.