Industrial & Engineering Chemistry Fundamentals · 1982 · 20 citations · 0 references
Natural SciencesChemical EngineeringMaterials ScienceMaterials CharacterizationRheologyThin FilmsContact AngleThin-film DepositionFilm ThicknessFilm Thickness ControlFilm Thickness MeasurementLiquid Film ThicknessRotating Disk ApparatusThin Liquid Films
ADVERTISEMENT RETURN TO ISSUEPREVArticleNEXTFilm thickness of a Bingham liquid on a rotating diskShiro Matsumoto, Yoichi Takashima, Tamotsu Kamiya, Akira Kayano, and Yoshihisa OhtaCite this: Ind. Eng. Chem. Fundamen. 1982, 21, 3, 198–202Publication Date (Print):August 1, 1982Publication History Published online1 May 2002Published inissue 1 August 1982https://pubs.acs.org/doi/10.1021/i100007a002https://doi.org/10.1021/i100007a002research-articleACS PublicationsRequest reuse permissionsArticle Views230Altmetric-Citations17LEARN ABOUT THESE METRICSArticle Views are the COUNTER-compliant sum of full text article downloads since November 2008 (both PDF and HTML) across all institutions and individuals. These metrics are regularly updated to reflect usage leading up to the last few days.Citations are the number of other articles citing this article, calculated by Crossref and updated daily. Find more information about Crossref citation counts.The Altmetric Attention Score is a quantitative measure of the attention that a research article has received online. Clicking on the donut icon will load a page at altmetric.com with additional details about the score and the social media presence for the given article. Find more information on the Altmetric Attention Score and how the score is calculated. Share Add toView InAdd Full Text with ReferenceAdd Description ExportRISCitationCitation and abstractCitation and referencesMore Options Share onFacebookTwitterWechatLinked InRedditEmail Other access options Get e-Alerts