Applied Optics · 2000 · 89 citations · 11 references
EngineeringOptical PropertiesInfrared OpticPhotonic Integrated CircuitInstrumentation1300–1600-Nm RangeSingle-photon CountingPhotonicsElectrical EngineeringPhysicsDark Count RatesPhotoelectric MeasurementIngaas Avalanche PhotodiodesCorrelated AfterpulsesPhoton StatisticInfrared SensorApplied PhysicsPhoton CountingQuantum Photonic DeviceOptoelectronics
We evaluate the performance of various commercially available InGaAs/InP avalanche photodiodes for photon counting in the infrared at temperatures that can be reached by Peltier cooling. We find that dark count rates are high, and this can partially saturate devices before optimum performance is achieved. At low temperatures the dark count rate rises because of a strong contribution from correlated afterpulses. We discuss ways of suppressing these afterpulses for different photon-counting applications.
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“Plug and play” systems for quantum cryptography
Applied Physics Letters · 1997 · 344 citations · Full text
Engineering, Optical Transmission System, Interferometry +18
Performance of InGaAs/InP avalanche photodiodes as gated-mode photon counters
G. Ribordy, Jean-Daniel Gautier, Hugo Zbinden et al. · Applied Optics · 1998 · 186 citations
Single-photon detection beyond 1 μm: performance of commercially available InGaAs/InP detectors
Andrea L. Lacaita, Franco Zappa, S. Cova et al. · Applied Optics · 1996 · 161 citations