Publication | Closed Access
X-ray Crystallographic Analysis of a 3-Silacyclopropene with Electronegative Substituents on Silicon
37
Citations
6
References
1998
Year
Materials ScienceInorganic ChemistryElectronegative SubstituentsEngineeringChemical BondSiliceneElectron Density DistributionX-ray Crystallographic AnalysisChemistryBond DeformationSilicon On InsulatorOrganometallic PolymerCrystallographyRing Structure Deformation
X-ray crystallographic analysis of 3,3-bis(diisopropylamino)-1,2-bis(trimethylsilyl)-3-silacyclopropene (1) gave the first experimental evidence for significant substituent effects on the ring structure deformation due to the interaction between the π-type σ*-orbital of silicon−nitrogen bonds and the CC π-bonding orbital. The degree of bond deformation in 1 was estimated by electron density distribution in the ring plane.
| Year | Citations | |
|---|---|---|
Page 1
Page 1