Concepedia

Elaboration and characterization of nanocrystalline TiO2 thin films prepared by sol–gel dip-coating

R. Mechiakh, N. Ben Sédrine, J. Ben Naceur, R. Chtourou

Surface and Coatings Technology · 2011 · 68 citations · 42 references

DOI

Concepts

References

42

<i>Ellipsometry and Polarized Light</i>

R. M. A. Azzam, N. M. Bashara, Stanley S. Ballard · Physics Today · 1978 · 4.3K citations

, , +13

Elements of X-ray diffraction

H. Lipson · Contemporary Physics · 1979 · 3.5K citations

, , +9

The one phonon Raman spectrum in microcrystalline silicon

H. Richter, Z. P. Wang, L. Ley · Solid State Communications · 1981 · 2.3K citations

, , +13

The effects of microcrystal size and shape on the one phonon Raman spectra of crystalline semiconductors

I. H. Campbell, P. M. Fauchet · Solid State Communications · 1986 · 2.2K citations

, , +16

Ellipsometry and Polarized Light

L. Cox · Optica Acta International Journal of Optics · 1978 · 1.9K citations

, , +9