Publication | Closed Access
Determination of the phase composition of surface layers of porous silicon by ultrasoft X-ray spectroscopy and X-ray photoelectron spectroscopy techniques
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Citations
3
References
2001
Year
Materials ScienceSurface CharacterizationEngineeringNanoporous MaterialSurface AnalysisSurface ScienceApplied PhysicsUltrasoft X-ray SpectroscopyPorosityPhase CompositionSilicon On InsulatorPorous Silicon
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