Publication | Closed Access
A 4-GS/s 4-bit Flash ADC in 0.18-$\mu{\hbox {m}}$ CMOS
105
Citations
26
References
2007
Year
Engineering0.18-Mum Digital CmosData ConverterAnalog DesignMixed-signal Integrated CircuitComputer EngineeringMeasured EnobDigital Circuit DesignComparator RedundancyMicroelectronicsAnalog-to-digital Converter
A 4-bit noninterleaved flash ADC implemented in 0.18-mum digital CMOS achieves a sampling rate of 4 GS/s. A 32 mum by 32 mum, on-chip differential inductor in each comparator extends the sampling rate without an increase in power consumption. A combination of DAC trimming and comparator redundancy reduces the measured DNL and INL to less than 0.15 LSB and 0.24 LSB, respectively. The measured ENOB with a 100 MHz full-power input is 3.84 bits and 3.48 bits, at 3 GS/s and 4GS/s, respectively. The ADC achieves a bit error rate of less than 10 <sup xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">-11</sup> at 4 GS/s.
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