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A new method of determining the atom form factor by high-voltage electron diffraction. An application of the effect of vanishing of the second-order reflexion
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1968
Year
EngineeringSecond-order ReflexionAccelerating Voltage EcElectron DiffractionComputational ChemistryChemistryElectronic StructureSynchrotron Radiation SourceElectron SpectroscopyInstrumentationAtom Form FactorElectrical EngineeringPhysicsHigher Order ReflectionsAtomic PhysicsQuantum ChemistryFirst Order ReflectionNatural SciencesParticle PhysicsCondensed Matter PhysicsApplied PhysicsX-ray DiffractionHigh-voltage Electron Diffraction
The accelerating voltage Ec at which a second order Kikuchi line vanishes was measured for 220 of iron (305 kV), and 222 of nickel (295 kV) and aluminium (430 kV). A measured value of Ec made it possible to determine accurately the X-ray atom form factor fX for the first order reflection assuming those for the second and higher order reflections.