Analysis of electron beam damage of exfoliated MoS2 sheets and quantitative HAADF-STEM imaging - Concepedia

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Publication | Open Access

Analysis of electron beam damage of exfoliated MoS2 sheets and quantitative HAADF-STEM imaging

DOI Full Paper Access

78

Citations

32

References

2014

Year

Alejandra García‐García, Andrés M. Raya, Marcelo M. Mariscal, Rodrigo Esparza, M. Herrera, Sergio I. Molina, Giovanni Scavello, Pedro L. Galindo, Miguel José–Yacamán, Arturo Ponce

Ultramicroscopy

Materials ScienceEngineeringElectron MicroscopyMicroscopyElectron SpectroscopySurface ScienceApplied PhysicsMicroanalysisElectron DiffractionElectron Beam DamageElectron MicroscopeExfoliated Mos2 SheetsQuantitative Haadf-stem Imaging

References

	Year	Citations

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