Publication | Closed Access
High-k dielectric oxides obtained by PLD as solution for gates dielectric in MOS devices
39
Citations
11
References
2007
Year
Materials ScienceHigh-k Dielectric OxidesElectrical EngineeringMos DevicesEngineeringSemiconductor DeviceNanoelectronicsOxide ElectronicsApplied PhysicsTime-dependent Dielectric BreakdownSemiconductor MaterialMicroelectronicsElectrical Insulation
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