Journal of Applied Physics · 1963 · 15 citations · 6 references
EngineeringElectrical EngineeringOptoelectronicsPhotonicsSemiconductor DevicesSemiconductor LasersSilicon MaterialsSilicon PhotonicsJunction TransientsMutual CouplingOhmic ContactsSilicon Electrical PropertiesTrigger Processing
Mutual interaction between microplasmas in silicon p-n junctions was found to be present if the conducting time of microplasmas reaches the magnitude of 10−7−10−6 sec. Then a conducting microplasma may trigger the conduction of others. The resulting pulses show multistable levels. Several examples of such a pulse form, caused by the trigger process, are given. Measurements have shown that the microplasmas investigated do not lie close together and that a cluster form for microplasmas is not a necessary condition for a mutual interaction. A simultaneous, independent operation of several microplasmas was found to be very improbable if one or more of the working microplasmas reach pulse lengths of the order of 10−4−10−3 sec.
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Avalanche Breakdown in Silicon
K. G. McKay · Physical Review · 1954 · 478 citations
Theory of Microplasma Instability in Silicon
R.J. McIntyre · Journal of Applied Physics · 1961 · 176 citations
Engineering, Electrical Engineering, Electronic Materials +16
David J. Rose · Physical Review · 1957 · 112 citations
Microplasma Fluctuations in Silicon
K.S. Champlin · Journal of Applied Physics · 1959 · 82 citations
B. Senitzky, J.L. Moll · Physical Review · 1958 · 54 citations