Radiation damage of silicon detectors by monoenergetic neutrons and electrons

Deep-level transient spectroscopy: A new method to characterize traps in semiconductors

D. V. Lang · Journal of Applied Physics · 1974 · 3.7K citations

Transient Grating, Engineering, Exponential Capacitance Transients +18

Capacitance Transient Spectroscopy

G. L. Miller, D. V. Lang, Lionel C. Kimerling · Annual Review of Materials Science · 1977 · 556 citations

Materials Science, Metallic Materials, Electrical Engineering +15

Fast neutron damage in silicon detectors

H.W. Kraner, Z. Li, K. -U. Pösnecker · Nuclear Instruments and Methods in Physics Research Section A Accelerators Spectrometers Detectors and Associated Equipment · 1989 · 62 citations

Radiation Detection, Nuclear Physics, Physics +3

Silicon detector developments for calorimetry: Technology and radiation damage

E. Fretwurst, H. Herdan, G. Lindström et al. · Nuclear Instruments and Methods in Physics Research Section A Accelerators Spectrometers Detectors and Associated Equipment · 1990 · 52 citations

Engineering, Radiation Detection, Physics +6

Deep-level transient spectroscopy measurements of majority carrier traps in neutron irradiated n-type silicon detectors

E. Borchi, C. Bertrand, C. Leroy et al. · Nuclear Instruments and Methods in Physics Research Section A Accelerators Spectrometers Detectors and Associated Equipment · 1989 · 43 citations · Full text

Majority Carrier Traps, Engineering, Radiation Detection +7