Optics Communications · 1982 · 17 citations · 13 references
Natural SciencesMaterials EngineeringMaterials ScienceMaterials CharacterizationSurface ScienceThin FilmsOptical Thin FilmsSurface CharacterizationSurface MetrologySurface RoughnessThin Film Surface MorphologyThin-film MaterialsSurface Roughness AnalysisSurface Roughness MeasurementSurface Roughness ParametersThin Film Surface CharacterizationThin Film Surface Roughness
13
Surface raman spectroelectrochemistry
David L. Jeanmaire, Richard P. Van Duyne · Journal of Electroanalytical Chemistry · 1977 · 4.7K citations
Optical heterodyne profilometry
Gary E. Sommargren · Applied Optics · 1981 · 246 citations
Natural Sciences, Physics, Optics +16