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Annealing temperature dependent on structural, optical and electrical properties of indium oxide thin films deposited by electron beam evaporation method

Materials ScienceElectrical EngineeringOptical MaterialsEngineeringTemperature DependentEpitaxial GrowthOxide ElectronicsApplied PhysicsThin FilmsMolecular Beam EpitaxyMicroelectronicsElectrical PropertiesOptoelectronicsThin Film Processing