Concepedia

Texture, residual stress and structural analysis of thin films using a combined X-ray analysis

Luca Lutterotti, Daniel Chateigner, S. Ferrari, J. Ricote

Thin Solid Films · 2004 · 446 citations · 9 references

DOI

Concepts

References

9

Line profiles of neutron powder-diffraction peaks for structure refinement

H. M. Rietveld · Acta Crystallographica · 1967 · 3.6K citations

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X-Ray and Neutron Reflectivity : Principles and Applications

Rémi Lazzari · HAL (Le Centre pour la Communication Scientifique Directe) · 2009 · 477 citations

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Method for the simultaneous determination of anisotropic residual stresses and texture by x-ray diffraction

Mauro Ferrari, Luca Lutterotti · Journal of Applied Physics · 1994 · 343 citations

, , +17

Advances in Texture Analysis from Diffraction Spectra

S. Matthies, L. Lutteroti, H. R. Wenk · Journal of Applied Crystallography · 1997 · 157 citations

, , +17

On the diffractive determination of single-crystal elastic constants using polycrystalline samples

S. Matthies, H.G. Priesmeyer, Mark R. Daymond · Journal of Applied Crystallography · 2001 · 114 citations

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