Texture, residual stress and structural analysis of thin films using a combined X-ray analysis - Concepedia

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Texture, residual stress and structural analysis of thin films using a combined X-ray analysis

444

Citations

9

References

2004

Year

Luca Lutterotti, Daniel Chateigner, S. Ferrari, J. Ricote

Thin Solid Films

Materials ScienceCombined X-ray AnalysisEngineeringX-ray DiffractionApplied PhysicsStressstrain AnalysisSolid MechanicsResidual StressThin FilmsMechanics Of MaterialsMicrostructureThin Film Processing

References

	Year	Citations

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