Publication | Closed Access

Current progress in modeling self-heating effects in FD SOI devices and nanowire transistors

Device ModelingNanowire TransistorsElectrical EngineeringFd Soi DevicesCurrent ProgressEngineeringNanoelectronicsElectronic EngineeringBias Temperature InstabilityApplied PhysicsElectronic PackagingHeat TransferMicroelectronicsSemiconductor Device