Optical properties of tungsten oxide films as a function of their stoichiometry as determined by LIMA and XPS - Concepedia

Concepedia

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Optical properties of tungsten oxide films as a function of their stoichiometry as determined by LIMA and XPS

10

Citations

3

References

1987

Year

C.A. Bishop, G. J. Edge, I. Sutherland, RP Howson

Materials ScienceIi-vi SemiconductorOptical MaterialsEngineeringMaterial AnalysisOptical PropertiesOxide ElectronicsSurface ScienceApplied PhysicsOptical CeramicThin FilmsTungsten Oxide Films

References

	Year	Citations

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