Surface and depth profiling techniques using XPS applied to the study of nickel-containing environmental particles - Concepedia

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Surface and depth profiling techniques using XPS applied to the study of nickel-containing environmental particles

13

Citations

13

References

1993

Year

John Rickman, Richard W. Linton

Applied Surface Science

Materials ScienceSurface CharacterizationChemical EngineeringEnvironmental ChemistryEnvironmental MonitoringEngineeringCorrosionEnvironmental EngineeringSurface AnalysisSurface ScienceEnvironmental RemediationNickel-containing Environmental ParticlesTrace MetalMineral ProcessingElemental Characterization

References

	Year	Citations

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