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Surface ordering at the air–nematic interface. Part 2. A spectroscopic ellipsometry study of orientational order
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Citations
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References
2007
Year
Spectroscopic ellipsometry has been used to measure enhanced orientational ordering at the nematic–air interface of 8CB as the smectic A phase was approached by cooling from the isotropic phase. The depth profile of the orientational order has been estimated by calculating the ellipsometric parameters for a homeotropic uniaxial surface film on a uniaxial sub‐phase using the Abelès matrix method. This showed that the depth of the enhanced orientationally ordered region was ∼10 nm at 0.5°C above the nematic–smectic A transition. This is substantially less than the thickness of the region with surface enhanced smectic order as determined by neutron reflection and a model of the surface structure consistent with both sets of results is proposed.
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