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Thermal-stress stability of yttrium oxide as a buffer layer of metal-ferroelectric-insulator-semiconductor field effect transistor

Materials ScienceElectrical EngineeringEngineeringFerroelectric ApplicationOxide ElectronicsBias Temperature InstabilityBuffer LayerApplied PhysicsThermal-stress StabilitySemiconductor MaterialYttrium OxideSemiconductor Device