Carrier fluctuation noise in a MOSFET channel due to traps in the oxide - Concepedia

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Carrier fluctuation noise in a MOSFET channel due to traps in the oxide

39

Citations

5

References

1978

Year

Renuka Jindal, A. van der Ziel

Solid-State Electronics

Mosfet ChannelElectrical EngineeringEngineeringBias Temperature InstabilityApplied PhysicsCarrier Fluctuation NoiseNoiseMicroelectronics

References

	Year	Citations

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